Advances in electron microscopy: High resolution TEM and latest advances in detection technology

Date(s) 29th June 2017
Venue Bio21 Auditorium, 30 Flemington Rd, Parkville.

The third seminar of the 2017 “Advances in Electron Microscopy Seminar Series” will take place on Thursday 29th June, 12:00 – 1:00 pm.

JEOL will present their latest development in terms of TEM detection including but not limited to dual EDS detector systems for higher solid angle and detection speed, pixelated detectors for simultaneous capture of the spatially and angularly-resolved distribution of all transmitted electrons.

NO registration needed.




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