Atom Probe Tomography & Applications

Date(s) 23-23 June 2017
Venue UNSW Kensington Campus, Chemical Sciences Building (F10), Ground floor (west side of building), Room G37

Atom Probe Tomography (APT) is used to analyze the composition of solid materials and thin films by field evaporating individual ions from the surface of the material with a voltage or laser pulse. By combining ToF mass spectrometry with 3D position information, a 3D model of the specimen can be created, providing sub-nm spatial resolution.

Optimized for localized chemical analysis, APT has been used in many applications including:

• Semiconductors including silicon and III-V technology,
• Metallurgy including steels and other alloys,
• Ceramics and oxides, making APT an extremely versatile technique able to support various elements of R&D for academia, government, and industry. A selected set of applications will be presented.

10:30 – Introduction to the APT technique
11:00 – A survey of applications from various research fields
11:30 – Q&A session

Speaker:Thomas F. Kelly received his B.S. in Mechanical Engineering with highest honors from Northeastern University in 1977. He received a Ph.D. in Material Science from M.I.T in 1981. Tom joined the faculty of the Department of Metallurgical and Mineral Engineering of the University of Wisconsin-Madison in January 1983. He was a Full Professor from 1994 until his departure in 2001. Tom founded Imago Scientific Instruments now part of CAMECA to commercialize the atom-probe microscope. His invention, the Local Electrode Atom Probe, or LEAP, captures an atom-by-atom “picture” of a material and renders that image on a computer screen in 3-D.



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