Real-Time In Situ Correlative Microscopy for Cellular Biology

Date(s) 22nd June 2017
Venue Webinar

Webinar Content

CLEM is the ideal tool for life science researchers to study the relationship between form and function of either thin sections of cells or cultured cells. The benefits of simultaneous in situ CLEM with fuorescence and super resolution optical microscopy integrated into a Scanning Electron Microscope will be demonstrated by way of various biological applications. New developments in large area imaging using automated data acquisition and stitching will also be shown. A recent case study on Type 1 diabetes will also highlight the capabilities of DELMIC’s unique SECOM system.

Additional Information

In the life sciences, CLEM is the ideal tool for studying the relationship between form and function of either thin sections of cells or cultured cells. While the electron beam works to create an image that illustrates the detailed structure of a biological sample at an extremely high resolution, the fluorescence microscope that is combined with the SEM to form a CLEM system operates to mark and pinpoint particular elements of the sample. Such an integrated system is ideal for researchers who are concerned with studying samples at a very high resolution while also working accurately and efficiently. We therefore encourage ambitious researchers in the life sciences who want to learn more about how they can improve and streamline their research to sign up for the webinar.

Speaker – Sangeetha Hari

Sangeetha obtained her Bachelor of Science (Honours) in 2005 and Master’s degree (2007) from The University of Delhi, India. She went on to work as  a Research Scholar in atomic and molecular physics at the Tata Institute of Fundamental Research, Mumbai, India, until 2011, developing time-of-flight spectroscopy systems for the study of electron-molecule collisions and specific bond breaking in molecules. She went on to do a Ph.D. at the TU Delft (until 2016), The Netherlands, working on a novel technology for sub-30 nm lithography in the Scanning Electron Microscope. She developed imaging techniques to extract quantitative information from high resolution SEM images, using a combination of secondary and backscattered electron imaging with atomic force microscopy. She now works at Delmic BV as an applications specialist in correlative light and electron microscopy, developing new applications with the SECOM platform.



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