Thermo Fisher Scientific: Inaugural Australasian Scanning Electron and Ion Microscopy User Group Meeting

Date(s) 10-11 July 2017
Venue University of Wollongong

Thermo Fisher Scientific and the AMMS invite all interested parties to attend the Inaugural Australasian Scanning Electron and Ion Microscopy User Group Meeting to be held at the University of Wollongong. This meeting will comprise of seminar and demonstration workshop sessions, including keynote addresses and workshop seminars delivered by Thermo Fisher Scientific specialist Brandon Ven Leer.

Call for Abstracts – Abstracts can be submitted for 15 minute technical presentations on recent techniques and interesting samples they have performed imaging or FIB milling work on. One session per day will also be set aside for academic presentations of 30 minutes, targeted at Graduate student or Post Doc contribution. For submission, please contact Ryan Shaw.

Multiscale 3D Materials Characterization
The combination of Focused Ion Beams with Scanning Electron Microscopes (FIB/SEM) have enabled accessing microstructural information at and below the surface in 3D. The need is growing for a multiscale workflow that allows for structural and elemental characterization on engineered parts/materials from the mesoscale down to the nanoscale. Imaging and analysis of large feature materials in 3D is key to understanding the context of how a material behaves or gaining knowledge of failure in the system. Until recently, the available technologies have limited the volumes and depths of materials that can be analyzed at high resolution, ultimately restricting the insight into structural, crystallographic, and chemical properties. This is no longer the case. The introduction of the Helios PFIB, a Xe Plasma FIB/SEM technology, offers unrivaled access to regions of interest deep below the surface – combining serial section tomography with statistically relevant data analysis. The PFIB also means that large volumes of interest identified by microCT can be investigated in great detail.
Combining the FEI HeliScan microCT and Helios PFIB DualBeam enables characterization and ultimately a better understanding of natural or engineered systems in a workflow the spans from tens of millimeters to the nanoscale. The HeliScan microCT employs helical scanning technology, which is designed to enable fast, artifact-free imaging. The Helios PFIB DualBeam enables dramatically improved material removal rates compared to traditional methods of FIB serial sectioning – while maintaining exceptional surface quality and high-contrast, ultra high resolution imaging performance. We will discuss how these two technologies expand Thermo Fisher Scientific’s multiscale, multimodal workflow for energy and 3D print applications.



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