FIB focuses on all aspects related to the application and advancement of Focused Ion Beam (FIB) technology in various scientific disciplines.

Focused Ion Beam technology involves the use of a finely focused beam of ions to interact with samples at the nanoscale level. This powerful technique enables researchers to perform precise milling, cutting, deposition, imaging, and analysis of materials and biological samples. FIB is utilised in diverse fields, including materials science, electronics, semiconductor manufacturing, biology, geology, etc.

FIB special interest group aims to foster collaboration, knowledge sharing, and skill development among FIB users and researchers. The group act as a platform for scientists, engineers, and enthusiasts to connect, exchange ideas, and showcase their latest findings related to FIB applications and methodologies.

Membership information

Become a member of FIB special interest group by first joining our parent Society, AMMS. Special interest group membership is free after joining AMMS and ticking the FIB membership box on the AMMS application form.



Refer to the Contact Us page for a list of the FIB Executive Committee.




Membership offers unique professional networking opportunities, conference discounts, exclusive news and other great benefits. Members receive our Newsletter in print, and access to our online resources.

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